JPH0543291B2 - - Google Patents
Info
- Publication number
- JPH0543291B2 JPH0543291B2 JP62254146A JP25414687A JPH0543291B2 JP H0543291 B2 JPH0543291 B2 JP H0543291B2 JP 62254146 A JP62254146 A JP 62254146A JP 25414687 A JP25414687 A JP 25414687A JP H0543291 B2 JPH0543291 B2 JP H0543291B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- insulating film
- forming
- opening
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/051—Manufacture or treatment of FETs having PN junction gates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/80—FETs having rectifying junction gate electrodes
- H10D30/83—FETs having PN junction gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/351—Substrate regions of field-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/088—J-Fet, i.e. junction field effect transistor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/10—Lift-off masking
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/105—Masks, metal
Landscapes
- Junction Field-Effect Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62254146A JPH0195564A (ja) | 1987-10-08 | 1987-10-08 | 半導体装置の製造方法 |
US07/253,171 US4895811A (en) | 1987-10-08 | 1988-10-04 | Method of manufacturing semiconductor device |
DE3886871T DE3886871T2 (de) | 1987-10-08 | 1988-10-07 | Verfahren zur Herstellung eines Feldeffekttransistors mit Übergangsgatter. |
EP88116670A EP0311109B1 (en) | 1987-10-08 | 1988-10-07 | Method of manufacturing a field-effect transistor having a junction gate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62254146A JPH0195564A (ja) | 1987-10-08 | 1987-10-08 | 半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0195564A JPH0195564A (ja) | 1989-04-13 |
JPH0543291B2 true JPH0543291B2 (en]) | 1993-07-01 |
Family
ID=17260862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62254146A Granted JPH0195564A (ja) | 1987-10-08 | 1987-10-08 | 半導体装置の製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4895811A (en]) |
EP (1) | EP0311109B1 (en]) |
JP (1) | JPH0195564A (en]) |
DE (1) | DE3886871T2 (en]) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5273937A (en) * | 1988-01-08 | 1993-12-28 | Kabushiki Kaisha Toshiba | Metal semiconductor device and method for producing the same |
US5011785A (en) * | 1990-10-30 | 1991-04-30 | The United States Of America As Represented By The Secretary Of The Navy | Insulator assisted self-aligned gate junction |
DE4113969A1 (de) * | 1991-04-29 | 1992-11-05 | Telefunken Electronic Gmbh | Verfahren zur herstellung von ohmschen kontakten fuer verbindungshalbleiter |
US5536677A (en) * | 1994-12-01 | 1996-07-16 | Motorola, Inc. | Method of forming conductive bumps on a semiconductor device using a double mask structure |
US6609652B2 (en) * | 1997-05-27 | 2003-08-26 | Spheretek, Llc | Ball bumping substrates, particuarly wafers |
US6051856A (en) * | 1997-09-30 | 2000-04-18 | Samsung Electronics Co., Ltd. | Voltage-controlled resistor utilizing bootstrap gate FET |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2824026A1 (de) * | 1978-06-01 | 1979-12-20 | Licentia Gmbh | Verfahren zum herstellen eines sperrschicht-feldeffekttransistors |
JPS57178376A (en) * | 1981-04-27 | 1982-11-02 | Sumitomo Electric Ind Ltd | Junction type field-effect transistor |
JPS57178374A (en) * | 1981-04-27 | 1982-11-02 | Sumitomo Electric Ind Ltd | Junction type field-efect transistor and its manufacture |
DE3150412A1 (de) * | 1981-12-19 | 1983-07-14 | Drägerwerk AG, 2400 Lübeck | Notatemschutzgeraet |
JPS58143586A (ja) * | 1982-02-22 | 1983-08-26 | Toshiba Corp | 電界効果トランジスタの製造方法 |
JPS58145158A (ja) * | 1982-02-23 | 1983-08-29 | Toshiba Corp | 電界効果トランジスタ及びその製造方法 |
US4561169A (en) * | 1982-07-30 | 1985-12-31 | Hitachi, Ltd. | Method of manufacturing semiconductor device utilizing multilayer mask |
JPS61163664A (ja) * | 1985-01-11 | 1986-07-24 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
JPS61177780A (ja) * | 1985-02-01 | 1986-08-09 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
FR2579827B1 (fr) * | 1985-04-01 | 1987-05-15 | Thomson Csf | Procede de realisation d'un transistor a effet de champ a metallisation de grille autoalignee |
JPS6273676A (ja) * | 1985-09-26 | 1987-04-04 | Nec Corp | 接合型電界効果トランジスタの製造方法 |
US4729967A (en) * | 1987-04-09 | 1988-03-08 | Gte Laboratories Incorporated | Method of fabricating a junction field effect transistor |
-
1987
- 1987-10-08 JP JP62254146A patent/JPH0195564A/ja active Granted
-
1988
- 1988-10-04 US US07/253,171 patent/US4895811A/en not_active Expired - Lifetime
- 1988-10-07 DE DE3886871T patent/DE3886871T2/de not_active Expired - Lifetime
- 1988-10-07 EP EP88116670A patent/EP0311109B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0311109A3 (en) | 1989-07-12 |
JPH0195564A (ja) | 1989-04-13 |
EP0311109A2 (en) | 1989-04-12 |
DE3886871D1 (de) | 1994-02-17 |
DE3886871T2 (de) | 1994-06-09 |
EP0311109B1 (en) | 1994-01-05 |
US4895811A (en) | 1990-01-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |